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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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ADVANCES IN IMAGING AND ELECTRON PHYSICS
VOLUME 106
EDITOR-IN-CHIEF
PETER W. HAWKES CEMESILaboratoire d’Optique Electronique du Centre National de la Recherche ScientiJique Toulouse, France
ASSOCIATE EDlTORS
BENJAMIN KAZAN Xerox Corporation Palo Alto Research Center Palo Alto, California
TOM MULVEY Department of Electronic Engineering and Applied Physics Aston University Birmingham, United Kingdom
Advances in
Imaging and Electron Physics EDITEDBY PETER HAWKES CEMESILaboratoire d'Optique Electronique du Centre National de la Recherche Scient$que
Toulouse, France
VOLUME 106
ACADEMIC PRESS San Diego London Boston New York Sydney Tokyo Toronto
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CONTENTS . . . . . . . . . . . . . . . . . . . .
CONTRIBUTORS . . . . . PREFACE. . . . . . . .
vii ix
Effects of Radiation Damage on Scientific Charge Coupled Devices T . D . HARDY.M . J . DEEN.AND R . MUROWINSKI
I. I1 . Ill . IV . V. VI . VII .
Introduction . . . . . . . . . . . . . . . Device Structure and Operation . . . . . . Radiation Damage . . . . . . . . . . . . Dark Current . . . . . . . . . . . . . . Charge Transfer Efficiency . . . . . . . . ReadNoise . . . . . . . . . . . . . . . Conclusions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . References
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2 11 26 36 48 66 86 88
CAD Using Green’s Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators CLIFFORD M . KR