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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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ADVANCES IN IMAGING AND ELECTRON PHYSICS VOLUME 106 EDITOR-IN-CHIEF PETER W. HAWKES CEMESILaboratoire d’Optique Electronique du Centre National de la Recherche ScientiJique Toulouse, France ASSOCIATE EDlTORS BENJAMIN KAZAN Xerox Corporation Palo Alto Research Center Palo Alto, California TOM MULVEY Department of Electronic Engineering and Applied Physics Aston University Birmingham, United Kingdom Advances in Imaging and Electron Physics EDITEDBY PETER HAWKES CEMESILaboratoire d'Optique Electronique du Centre National de la Recherche Scient$que Toulouse, France VOLUME 106 ACADEMIC PRESS San Diego London Boston New York Sydney Tokyo Toronto This book is printed on acid-free paper. @ Copyright Q 1999 by ACADEMIC PRESS All rights Reserved. No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the Publisher. The appearance of the code at the bottom of the first page of a chapter in this book indicates the Publisher’s consent that copies of the chapter may be made for personal or internal use of specific clients. This consent is given on the condition, however, that the copier pay the stated per copy fee through the Copyright Clearance Center, Inc. (222 Rosewood Drive, Danvers, Massachusetts 01923), for copying beyond that permitted by Sections 107 or 108 of the U.S. Copyright Law. This consent does not extend to other kinds of copying, such as copying for general distribution, for advertising or promotional purposes, for creating new collective works, or for resale. Copy fees for pre-1999 chapters are as shown on the title pages. If no fee code appears on the title page, the copy fee is the same as for current chapters. 1076-5670/99 $30.00 Academic Press division of Hartcourt Brace & Company 525 B Street, Suite 1900, San Diego, California 92101-4495, USA http://www.apnet.com (I United Kingdom Edition published by Academic Press 24-28 Oval Road, London NW1 7DX, UK htt p://www.hbuk.co.uk/ap/ International Standard Book Number: 0-12-014748-3 PRINTED IN THE UNITED STATES OF AMERICA 98 99 00 01 02 03 QW 9 8 7 6 5 4 3 2 1 CONTENTS . . . . . . . . . . . . . . . . . . . . CONTRIBUTORS . . . . . PREFACE. . . . . . . . vii ix Effects of Radiation Damage on Scientific Charge Coupled Devices T . D . HARDY.M . J . DEEN.AND R . MUROWINSKI I. I1 . Ill . IV . V. VI . VII . Introduction . . . . . . . . . . . . . . . Device Structure and Operation . . . . . . Radiation Damage . . . . . . . . . . . . Dark Current . . . . . . . . . . . . . . Charge Transfer Efficiency . . . . . . . . ReadNoise . . . . . . . . . . . . . . . Conclusions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 11 26 36 48 66 86 88 CAD Using Green’s Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators CLIFFORD M . KR