Handbook Of X-ray Data

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This sourcebook is intended as an X-ray data reference for scientists and engineers working in the field of energy or wavelength dispersive X-ray spectrometry and related fields of basic and applied research, technology, or process and quality controlling. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (americium). This includes X-ray energies, emission rates and widths as well as level characteristics such as binding energies, fluorescence yields, level widths and absorption edges. The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed. This reference book addresses all researchers and practitioners working with X-ray radiation and fills a gap in the available literature.

E-Book Content

Günter Zschornack Handbook of X-Ray Data Günter Zschornack Handbook of X-Ray Data With 113 Figures and 161 Tables 123 Ass.-Prof. Dr. rer. nat. habil. Günter Zschornack Technische Universität Dresden Institut für Angewandte Physik Mommsenstraße 13 01062 Dresden [email protected] Library of Congress Control Number: 2006937001 ISBN 978-3-540-28618-9 Springer Berlin Heidelberg New York This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable for prosecution under the German Copyright Law. Springer is a part of Springer Science+Business Media springer.com © Springer-Verlag Berlin Heidelberg 2007 The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. Typesetting: PTP-Berlin GmbH, Berlin Production: LE-TEX Jelonek, Schmidt & Vöckler GbR, Leipzig Cover: WMXDesign, Heidelberg Printed on acid-free paper 57/3100/YL - 5 4 3 2 1 0 Preface Today, with energy-dispersive and wavelengthdispersive techniques, modern methods in X-ray analysis are used in a wide range of applications, as for example in X-ray fluorescence analysis, electron microbeam analysis,X-ray fluorescence analysis with charged particles, and so on. In many applications – for instance in metallurgy, mining, microelectronics, medicine, biology, environmental protection, chemistry, archeology, X-ray astronomy, and so on – fast and effective information about the probes under investigation can be obtained by simultaneous multielement analysis. Therefore, it is of outstanding importance for every analyst to have a carefully edited collection of basic atomic data. This is also true in the age of the communication society, where a large quantity of data is available via the Internet. Practical experience shows that it is still important to have data sets in the form of printed matter. This is even more important, because much of the data available in the Internet are given without correct citation of data sources and without any evaluation. Accurate sets of atomic data are necessary for the calibration of energy- and wavelength-dispersive Xray spec
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