ADVANCES IN IMAGING AND ELECTRON PHYSICS VOLUME 146
EDITOR-IN-CHIEF
PETER W. HAWKES CEMES-CNRS Toulouse, France
HONORARY ASSOCIATE EDITORS
TOM MULVEY BENJAMIN KAZAN
Advances in
Imaging and Electron Physics
E DITED BY
PETER W. HAWKES CEMES-CNRS Toulouse, France
VOLUME 146
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CONTENTS
C ONTRIBUTORS . . . . . . . . . . . . . . . . . . . . . . . . . . . P REFACE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . F UTURE C ONTRIBUTIONS . . . . . . . . . . . . . . . . . . . . . .
vii ix xi
Spiral Phase Microscopy S EVERIN F ÜRHAPTER , A LEXANDER J ESACHER , C HRISTIAN M AURER , S TEFAN B ERNET, AND M ONIKA R ITSCH -M ARTE I. Introduction . . . . . . . . . . . . . . . . . . . . . . . . . II. Isotropic Edge Enhancement with a Spiral Phase Filter . . . . III. Asymmetric Edge Enhancement Using a Modified Spiral Phase Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IV. Rotating Shadow Effect . . . . . . . . . . . . . . . . . . . . V. Optically Thick Samples—Spiral Interferometry . . . . . . . VI. Summary and Outlook . .