Transmission Electron Microscopy Of Minerals And Rocks (cambridge Topics In Mineral Physics And Chemistry)

TRANSMISSION ELECTRON MICROSCOPY OF MINERALS AND ROCKS CAMBRIDGE TOPICS IN MINERAL PHYSICS AND CHEMISTRY Editors Dr. Andrew Putnis Dr. Robert C. Liebermann Ferroelastic and co-elastic crystals E. K. s. SALJE Transmission electron microscopy of minerals and rocks ALEX c. MCLAREN Introduction to the physics of the Earth's interior JEAN-PAUL POIRIER Transmission electron microscopy of minerals and rocks ALEX c. MCLAREN Australian National University The right of the University of Cambridge to print and sell all manner of books was granted by Henry VIII in 1534. The University has printed and published continuously since 1584. CAMBRIDGE UNIVERSITY PRESS CAMBRIDGE NEW YORK PORT CHESTER MELBOURNE SYDNEY CAMBRIDGE UNIVERSITY PRESS Cambridge, New York, Melbourne, Madrid, Cape Town, Singapore, Sao Paulo Cambridge University Press The Edinburgh Building, Cambridge CB2 2RU, UK Published in the United States of America by Cambridge University Press, New York www.cambridge.org Information on this title: www.cambridge.org/9780521350983 © Cambridge University Press 1991 This publication is in copyright. Subject to statutory exception and to the provisions of relevant collective licensing agreements, no reproduction of any part may take place without the written permission of Cambridge University Press. First published 1991 This digitally printed first paperback version 2005 A catalogue recordfor this publication is available from the British Library Library of Congress Cataloguing in Publication data McLaren, Alex C. Transmission electron microscopy of minerals and rocks / Alex C. McLaren. p. cm. - (Cambridge topics in mineral physics and chemistry) Includes bibliographical references. ISBN 0-521-35098-0 1. Mineralogy, Determinative. 2. Transmission electron microscopes. I. Title. II. Series. QE369.M5M36 1991 549'. 1 2 - d c 2 0 90-20039 CIP ISBN-13 978-0-521-35098-3 hardback ISBN-10 0-521-35098-0 hardback ISBN-13 978-0-521 -35943-6 paperback ISBN-10 0-521-35943-0 paperback Contents Preface page xi Introduction 1 1 Principles of image formation by a lens 1.1 Introduction 1.2 Elementary concepts of image formation by a thin lens 1.3 Image formation by a thin lens in terms of Fourier optics 1.4 The Porter experiments 1.5 Imaging a defect in a periodic structure 1.6 Coherence 7 7 7 2 The transmission electron microscope 2.1 Introduction 2.2 The optical microscope 2.3 General description of the transmission electron microscope 2.4 The electron wavelength 2.5 Lens aberrations and the practical limit of resolution 2.6 Defect of focus 2.7 Specimens and specimen preparation 2.8 Modes of operation 3 Kinematical theory of electron diffraction 3.1 Introduction 3.2 Derivation of the Laue equations 3.3 Reciprocal lattice 3.4 Ewald sphere construction in reciprocal space 3.5 The relative intensities of the waves diffracted by a unit cell: the structure factor F(hkl) 13 22 31 33 37 37 37 39 41 42 44 49 50 52 52 52 57 58 60 vi Contents 3.6 3.7 3.8 3.9 3.10 3.11 The atomic scattering factor Intensity of the wave diffracted from a perfect crystal The electron diffraction camera Kikuchi lines and bands Convergent beam electron diffraction (CBED) Image contrast in terms of the kinematical theory of diffraction 3.12 Reexamination of the foundations of the kinematical theory 63 69 74 75 82 4 Dynamical theory of electron diffraction 4.1 Introduction 4.2 Solution of the Schrodinger equation 4.3 The dispersion surface 4.4 Selection of active tie points: boundary conditions at entrance face of the crystal 4.5 The exit waves 4.6 Calculation of the intensities of the transmitted and diffracted waves without absorption 4.7 Discussion of 70 and / g for no absorption 4.8 Absorption 4.9 D