Quantum Metrology: Foundation Of Units And Measurements

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The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.

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Ernst O. Göbel and Uwe Siegner Quantum Metrology: Foundation of Units and Measurements Related Titles Servin, M., Quiroga, J.A., Padilla, M. Sheil, B. Fringe Pattern Analysis for Optical Metrology Theory, Algorithms, and Applications High Definition - Zero Tolerance in Design and Production 2014 ISBN 978-3-527-41152-8, also available in electronic formats 2014 ISBN: 978-1-118-45185-4, also available in electronic formats Quinten, M. Gläser, M., Kochsiek, M. (eds.) A Practical Guide to Optical Metrology for Thin Films Handbook of Metrology 2012 ISBN 978-3-527-41167-2, also available in electronic formats Cong, S. Control of Quantum Systems Theory and Methods 2013 ISBN 978-1-118-60812-8, also available in electronic formats 2010 ISBN: 978-3-527-40666-1 Riehle, F. Frequency Standards: Basics and Applications 2006 ISBN: 978-3-527-60595-8 (ebook) Ernst O. Göbel and Uwe Siegner Quantum Metrology: Foundation of Units and Measurements Authors Professor Dr. Ernst O. Göbel Physikalisch-Technische Bundesanstalt Bundesallee 100 38116 Braunschweig Germany All books published by Wiley-VCH are carefully produced. Nevertheless, authors, editors, and publisher do not warrant the information contained in these books, including this book, to be free of errors. Readers are advised to keep in mind that statements, data, illustrations, procedural details or other items may inadvertently be inaccurate. Dr. Uwe Siegner Physikalisch-Technische Bundesanstalt Bundesallee 100 38116 Braunschweig Germany Library of Congress Card No.: applied for British Library Cataloguing-in-Publication Data A catalogue record for this book is available from the British Library. Cover Pictures courtesy of A. Nicolaus (upper left hand corner, compare figure 7.4) and A. Müller (lower left hand corner, compare figure 6.10), Physikalisch-Technische Bundesanstalt, Braunschweig, Germany. Other picture courtesy of the authors. Bibliographic information published by the Deutsche Nationalbibliothek The Deutsche Nationalbibliothek lists this publication in the Deutsche Nationalbibliografie; detailed bibliographic data are available on the Internet at . © 2015 Wiley-VCH Verlag GmbH & Co. KGaA, Boschstr. 12, 69469 Weinheim, Germany All rights reserved (including those of translation into other languages). No part of this book may be reproduced in any form – by photoprinting, microfilm, or an
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