E-Book Overview
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
E-Book Content
ENCYCLOPEDIA OF MATERIALS CHARACTERIZATION
MATERIALS CHARACTERIZATION SERIES
Surfaces, Interfaces, Thin Films
Series Editors: C. Richard Brundle and Charles A. Evans, Jr. Series Titles Encyclopedia of Materiah Characterization, C. Richard Brundle, Charles k Evans, Jr., and Shaun Wilson Characterizationof Mekth and Alloys, Paul.H. Holloway and P. N.
Vaidyanathan Characterizationof Ceramics, Ronald E. Loehman Characterimtion of Pobmers, Ned J. Chou, Stephen P. Kowalczyk, Ravi Sard, and Ho-Ming Tong Characterizationin Silicon Processing, Yale Strausser Characterizationin Compound Semiconductor Processing,
Yale Strausser Characterizationof Integraed CircuitPackaging Materiah,
Thomas M. Moore and Robert G. McKenna Characterizationof Cadytic Materiah, Israel E. Wachs Characterizationof Composite Materiah, Hatsuo Ishida Characterizationof OpticalMateriah, Gregory J. Exarhos Characterizationof Tribological Materiah, William A. Glaeser Characterizationof Organic Thin Films,Abraham Ulman
ENCYCLOPEDIA OF MLATERIALS CHARACTERIZATION Surfaces, Interfaces, Thin Films
EDITORS
C Ricbard Brundle