Esd In Silicon Integrated Circuits

E-Book Overview

* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits.* Provides guidance on the implementation of circuit protection measures.* Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts.* Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.

E-Book Content

ESD in Silicon Integrated Circuits, 2nd Edition Ajith Amerasekera, Charvaka Duvvury c 2002 John Wiley & Sons, Ltd Copyright  ISBNs: 0-471-49871-8 (Hardback); 0-470-84605-4 (Electronic) ESD in Silicon Integrated Circuits Second Edition ESD in Silicon Integrated Circuits Second Edition Ajith Amerasekera Charvaka Duvvury Texas Instruments, Inc., USA With Warren Anderson Compaq Computer Corporation, USA Horst Gieser Fraunhofer Institute for Reliability and Microintegration IZM ATIS, Germany Sridhar Ramaswamy Texas Instruments, Inc., USA c 2002 by John Wiley & Sons, Ltd., Copyright  Baffins Lane, Chichester, West Sussex PO 19 1UD, England Phone (+44) 1243 779777 e-mail (for orders and customer service enquiries): [email protected] Visit our Home Page on http://www.wileyeurope.com or http://www.wiley.com All Rights Reserved. No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, scanning or otherwise, except under the terms of the Copyright, Designs and Patents Act 1988 or under the terms of a license issued by the Copyright Licensing Agency Ltd., 90 Tottenham Court Road, London W1P 0LP, UK without the permission in wr
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