E-Book Overview
This book aims to describe in detail the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion-implantation of semiconductors. Particular attention is given to the methods used to characterize small point-defect clusters such as dislocation loops, since the coverage of this topic in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. In-situ, high-resolution and analytical techniques are also described. The techniques are illustrated with examples, which serve to give an overview of the contribution of TEM to the present understanding of radiation damage mechanisms. The book will be most useful to researchers in, or entering into, the field of defect analysis in materials.
E-Book Content
Characterization of Radiation Damage by Transmission Electron Microscopy
Series in Microscopy in Materials Science Series Editors: B Cantor M J Goringe Other titles in the series Atlas of Backscattering Kikuchi Diffraction Patterns D J Dingley, K Z Baba-Kishi and V Randle ISBN: 0 7503 0212 7 Electron Microscopy of Interfaces in Metals and Alloys C T Forwood and L M Clarebrough ISBN: 0 7503 0116 3 The Measurement of Grain Boundary Geometry V Randle ISBN: 0 7503 0235 6 Topics in Electron Diffraction and Microscopy of Materials P Hirsch (ed) ISBN: 0 7503 0538 X
Forthcoming titles in the series Convergent Beam Electron Diffraction P A Midgley and M Saunders Electron Microscopy of Quasicrystals K Chattopadhyay and S Ranganathan Electron Microscopy of Catalysts P Gai-Boyes
Forthcoming topics in the series Magnetic Materials Microscopy of Ceramics Microscopy and Microanalysis Orientation Imaging Microscopy Phase Transformations STEM Semiconductor Materials
Series in Microscopy in Materials Scienc