E-Book Overview
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
E-Book Content
Semiconductor Device Reliability
NATO ASI Series Advanced Science Institutes Series
A Series presenting the results of activities sponsored by the NA TO Science Committee, which aims at the dissemination of advanced scientific and technological knowledge, with a view to strengthening links between scientific communities. The Series is published by an international board of publishers in conjunction with the NATO Scientific Affairs Division
A Life Sciences B Physics
Plenum Publishing Corporation London and New York
C Mathematical and Physical Sciences o Behavioural and Social Sciences E Applied Sciences
Kluwer Academic Publishers Dordrecht, Boston and London
F Computer and Systems Sciences G Ecological Sciences H Cell Biology
Springer-Verlag Berlin, Heidelberg, New York, London, Paris and Tokyo
Series E: Applied Sciences - Vol. 175
Semiconductor Device Reliability edited by
A. Christou Surface Physics Branch, Naval Research Laboratory, Washington, D.C., U.S.A. and
B. A. Unger Bell Communications Research, Red Bank, N.J., U.S.A.
Kluwer Academic Publishers Dordrecht / Boston / London Published in cooperation with NATO Scientific Affairs Division
Proceedings of the NATO Advanced Research Workshop on Semiconductor Device Reliability Heraklio, Crete, Greece June 4-9, 1989
Library of Congress Cataloging In Publication Data NATO Advanced Research Workshop on Semiconductor Device Reliability (1989 : Herakleion, Greece) Semiconductor device reliability. (NATO ASI series. Series E: Applied sciences ; vol. 175) "Published in cooperation with NATO Scientific Affairs Division." 1. Semiconductors--Reliability--Congress. I. Christou A. II. Unger, B. A. III. Title. IV. Series: NATO A.'SI series. Series E, Applied sciences no. 175. TK7871.85.N3758 1989 621.381'52 89-24589
ISBN-13: 978-94-010-7620-3 DOl: 10.1007/978-94-009-2482-6
e-ISBN-13: 978-94-009-2482-6
Published by Kluwer Academic Publishers, P.O. Box 17, 3300 AA Dordrecht, The Netherlands. Kluwer Academic Publishers incorporates the publishing programmes of D. Reidel, Martinus Nijhoff, Dr W. Junk and MTP Press. Sold and distributed in the U.S.A. and Canada by Kluwer Academic Publishers, 101 Philip Drive, Norwell, MA 02061, U.S.A. In all other countries, sold and distributed by Kluwer Academic Publishers Group, P.O. Box 322,3300 AH Dordrecht, The Netherlands. Printed on acid-free paper
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© 1990 by Kluwer Academic Publishers Softcover reprint of the hardcover 1st edition 1990 No part of the material protected by this copyright notice may be reproduced or utiliz