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This series covers a wide range of topics, stretching from the particle optics of accelerators, mass spectrometers, electron and ion microscopes, and of individual components of these instruments to theoretical and practical aspects of modern electroinics. Another broad intterest is digital image processing and pattern recognition, including the devices employed and the methods developed. Electron physics is interpreted very liberally and articles are often included on materials of current interest as well as on the devices that employ them. The object of the series is to provide articles that may review a new or rapidly developing field, or may cover many years of research, thus providing a small monograph on a specific subject. "Advances in Electronics and Electron Physics" Volume 86 features articles on the following topics: GaAs semiconductor memories; image processing; N-beam calculators; and electron optics.
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ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS VOLUME 86 EDITOR-IN-CHIEF PETER W. HAWKES Centre National de la Recherche Scient$que Toulouse. France ASSOCIATE EDITOR BENJAMIN KAZAN Xerox Corporation Palo Alto Research Center Palo Alto, California Advances in Electronics and Electron Physics EDITEDBY PETER W. HAWKES CEMESILaboratoire d’Optique Electronique du Centre National de la Recherche Scientijique Toulouse, France VOLUME 86 ACADEMIC PRESS, INC. Harcourt Brace Jovanovich, Publishers Boston San Diego New York London Sydney Tokyo Toronto This book is printed on acid-free paper. @ COPYRIGHT 0 1993 BY ACADEMIC PRESS,INC. ALL RIGHTS RESERVED. NO PART OF THIS PUBLICATION MAY BE REPRODUCED OR TRANSMITTED IN ANY FORM OR BY ANY MEANS, ELECTRONIC OR MECHANICAL, INCLUDING PHOTOCOPY, RECORDING, OR ANY INFORMATION STORAGE AND RETRIEVAL SYSTEM, WITHOUT PERMISSION IN WRITING FROM THE PUBLISHER. ACADEMIC PRESS, INC. 1250 Sixth Avenue, San Diego. CA 92101-4311 United Kingdom Edition published by ACADEMIC PRESS LIMITED 24-28 Oval Road, London NWI 7DX LIBRARY OF CONGRESS ISSN 0065-2539 ISBN 0-12-014728-9 CATALOG C A R D NUMBER: 49-7504 PRINTED IN THt UNITED STATES OF AMERICA 93 94 95 96 97 BC 9 8 7 6 5 4 3 2 1 CONTENTS CONTRIBUTORS . . . . . . . . . . . . . . . . . . . . . . . PREFACE. . . . . . . . . . . . . . . . . . . . . . . . . . Recent Advances in GaAs Dynamic Memories JAMESA . COOPER. JR. I . Introduction. Motivation. and Potential Applications . . . IT. pn-Junction Storage Capacitors . . . . . . . . . . . . I11. JFET and MESFET DRAM Cells . . . . . . . . . . . IV . Heterostructure DRAM Cells . . . . . . . . . . . . . V . Bipolar DRAMS. . . . . . . . . . . . . . . . . . . . VI . Future Directions . . . . . . . . . . . . . . . . . . References . . . . . . . . . . . . . . . . . . . . . . vii ix . . . . . Expert Systems for Image Processing. Analysis. and Recognition TAKASHI MATSUYAMA I . Introduction . . . . . . . . . . . . . . . . . . . . . I1. Expert Systems for Image Processing and Analysis (ESIPAs) 111. Representing Knowledge about Image Analysis Strategies . . IV . Representing Spatial Relations and Spatial Reasoning for Image Understanding . . . . . . . . . . . . . . . . . . Concluding Remarks . . . . . . . . . . . . . . . . . . References . . . . . . . . . . . . . . . . . . . . . . 1 6 32 44 59 64 77 81 87 124 143 163 168 n-beam Dynamical Calculations KAZUTO WATANABE I. I1. I11. IV . V. Introduction . . . . . . . . . . . . . n-beam Dynamical Calculation Methods Bethe Method . . . . . . . . . . . . . Multislice Method . . . . . . . . . . Coupled Differential Equations . . . . V . . . . . . . . . . . . .