E-Book Overview
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
E-Book Content
NanoScience and Technology NanoScience and Technology Series Editors: P. Avouris B. Bhushan D. Bimberg K. von Klitzing H. Sakaki R. Wiesendanger The series NanoScience and Technology is focused on the fascinating nano-world, mesoscopic physics, analysis with atomic resolution, nano and quantum-effect devices, nanomechanics and atomic-scale processes. All the basic aspects and technologyoriented developments in this emerging discipline are covered by comprehensive and timely books. The series constitutes a survey of the relevant special topics, which are presented by leading experts in the field. These books will appeal to researchers, engineers, and advanced students. Multiscale Dissipative Mechanisms and Hierarchical Surfaces Friction, Superhydrophobicity, and Biomimetics Editors: M. Nosonovsky, B. Bhushan Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods I Editors: B. Bhushan, H. Fuchs, S. Hosaka Applied Scanning Probe Methods XII Characterization Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods III Characterization Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods IV Industrial Application Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs, S. Kawata Applied Scanning Probe Methods VI Characterization Editors: B. Bhushan, S. Kawata Applied Scanning Probe Methods VII Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques Editors: B. Bhushan, H. Fuchs, M. Tomitori Applied Scanning Probe Methods IX Characterization Editors: B. Bhushan, H. Fuchs, M. Tomitori Applied Scanning Probe Methods X Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs, M. Tomitori Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications Editors: B. Bhushan, H. Fuchs Magnetic Microscopy of Nanostructures Editors: H. Hopster and H.P. Oepen The Physics of Nanotubes Fundamentals of Theory, Optics and Transport Devices Editors: S.V. Rotkin and S. Subramoney Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces By G. Kaupp Nanocatalysis Editors: U. Heiz, U. Landman Roadmap of Scanning Probe Microscopy Editors: S. Morita Nanostructures – Fabrication and Analysis Editor: H. Nejo Bharat Bhushan Harald Fuchs Applied Scanning Probe Methods XII Characterization With 101 Figures and 14 Tables Including 70 Color Figures Editors Prof. Dr. Bharat Bhushan Ohio State University Nanoprobe Laboratory for Bio- & Nanotechnology & Biomimetics (NLB2 ) 201 W.