ADVANCES IN IMAGING AND ELECTRON PHYSICS VOLUME 110 t PETER W. HAWKES CEMES/L.uboratoire d’ Optique Electronique du Centre National de la Recherche Scientifique Toulouse, France ASSOCIATE EDITORS BENJAMIN KAZAN Xerox Corporation Palo Alto Research Center Palo Alto, California TOM MULVEY Department of Electronic Engineering and Applied Physics Aston University Birmingham, United Kingdom Advances in Imaging and Electron Physics EDITEDBY PETER W. HAWKES CEMESLuboratoire d 'Optique Electronique du Centre National de la Recherche Scient$que Toulouse, France VOLUME 110 ACADEMIC PRESS A Harcourt Science and Technology Company San Diego San Francisco New York London Sydney Tokyo Boston This book is printed on acid-free paper. @ Copyright 0 1999 by Academic Press All rights reserved. No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. The appearance of the code at the bottom of the first page of a chapter in this book indicates the Publisher’s consent that copies of the chapter may be made for personal or internal use of specific clients. This consent is given on the condition, however, that the copier pay the stated per-copy fee through the Copyright Clearance Center, Inc. (222 Rosewood Drive, Danvers, Massachusetts 0 1923), for copying beyond that permitted by Sections 107 or 108 of the U.S. Copyright Law. This consent does not extend to other kinds of copying, such as copying for general distribution, for advertising or promotional purposes, for creating new collective works, or for resale. Copy fees for pre-I998 chapters are as shown on the title pages: if no fee code appears on the title page, the copy fee is the same as for current chapters. 1076-5670199 $30.00 ACADEMIC PRESS A Harcourt Science and Technology Company 525 B. St., Suite 1900, San Diego, California 92101-4495, USA http://www .apnet.com Academic Press 24-28 Oval Road, London NWl 7DX, UK http://www.hbuk.co.uWap/ International Standard Serial Number: 1076-5670 International Standard Book Number: 0-12-0 14752- 1 Typeset by Laser Words, Madras, India Printed in the United States of America 9 9 0 0 0 1 0 2 0 3 B B 9 8 7 6 5 4 3 2 1 CONTENTS CONTRIBUTORS . . . . . . . . . . . . . . PREFACE . . . . . . . . . . . . . . . . FORTHCOMING CONTRIBLJTORS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vii ix xi lnterference Scanning Optical Probe Microscopy: Principles and Applications W. S. BACSA I. Introduction: Wave Optical Properties near Surfaces 11. Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111. The Microscopic Perspective of Light-Matter Interaction: Wave Scattering . . . . . . . . . . . . . . . . . 4 IV. Formation of Standing Waves: Propagative and Nonpropagative Waves V. Imaging of Standing Waves: Shadow Formation and Detection through Probe Edge . . . . . . . . . . . . . . . . . . . . . . VI. Quantum Limit in Near-Field Imaging: Short versus Intermediate Distance Observation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 9 . 11 . 11 . 17 . . 21 . . . . Time-Resolving Microscopes . . . . . . . .