Selected Problems Of Computational Charged Particle Optics


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EDITOR-IN-CHIEF PETER W. HAWKES CEMES-CNRS Toulouse, France HONORARY ASSOCIATE EDITORS TOM MULVEY BENJAMIN KAZAN Academic Press is an imprint of Elsevier Radarweg 29, PO Box 211, 1000 AE Amsterdam, The Netherlands 84 Theobald’s Road, London WC1X 8RR, UK 30 Corporate Drive, Suite 400, Burlington, MA01803, USA 525 B Street, Suite 1900, San Diego, CA 92101-4495, USA First edition 2009 Copyright # 2009 Elsevier Inc. All rights reserved. No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any means electronic, mechanical, photocopying, recording or otherwise without the prior written permission of the publisher. Permissions may be sought directly from Elsevier’s Science & Technology Rights Department in Oxford, UK: phone (+44) (0) 1865 843830; fax (+44) (0) 1865 853333; email: [email protected] Alternatively you can submit your request online by visiting the Elsevier web site at http://elsevier.com/locate/ permissions, and selecting Obtaining permission to use Elsevier material. Notice No responsibility is assumed by the publisher for any injury and/or damage to persons or property as a matter of products liability, negligence or otherwise, or from any use or operation of any methods, products, instructions or ideas contained in the material herein. Because of rapid advances in the medical sciences, in particular, independent verification of diagnoses and drug dosages should be made. Library of Congress Cataloging-in-Publication Data A catalog record for this book is available from the Library of Congress British Library Cataloguing in Publication Data A catalogue record for this book is available from the British Library ISBN: 978-0-12-374717-4 ISSN: 1076-5670 For information on all Academic Press publications visit our Web site at www.books.elsevier.com Printed in the United States of America 09 10 10 9 8 7 6 5 4 3 2 1 PREFACE Charged-particle optics enables us to study an extensive family of devices. At one extreme we have electron beams of low current density traversing static electron lenses, while at the other there are broad beams in which the current density may be very high and the optic axis curved. D. Greenfield and M. Monastyrskiy have assembled here many of the mathematical tools needed to study such situations; there is more emphasis than in most of the related books on the charged-particle optics of systems in which the current density is significant and on time-dependent focusing. In these respects, the present text complements those intended for students of electron optics. The contents of the individual chapters are presented in the authors’ Foreword and not repeated here. I shall, however, just draw attention to Chapter 5, in which the approach to the study of aberrations developed by the authors, the tau-variation technique, is presented at length. I am very pleased to include this useful text in these Advances, where so many articles on related topics have appeared over the years. I have no doubt that many readers will profit from the explanations set out so clearly here. Peter W. Hawkes ix FOREWORD Il n’existe pas de sciences applique´es mais seulement des applications de la science.There are no such things as applied sciences, only applications of science. Louis Pasteur, 1872 Charged particle optics, as one of the most intellectually saturated branches of science, has borrowed its theoretical and numerical methods from classical and celestial mechanics, light optics, mathematical physics, and perturbation theory. Contemporary charged particle optics represents a peculiar ‘‘alloy’’ that includes charged particle optics itself as a study of the regularities of motion of
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