E-Book Overview
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
E-Book Content
Introduction to Scanning Tunneling Microscopy
C. JULIAN CHEN
OXFORD UNIVERSITY PRESS
Introduction to Scanning Tunneling Microscopy
OXFORD SERIES IN OPTICAL AND IMAGING SCIENCES EDITORS
MARSHALL LAPP JUN-ICHI NISHIZAWA BENJAMIN B. SNAVELY HENRY STARK ANDREW C. TAM TONY WILSON
1. D. M. Lubman (ed.). 2. D. Sarid.
Lasers and Mass Spectrometry
Scanning Force Microscopy
With Applications to Electric, Magnetic, and Atomic Forces 3. A. B. Schvartsburg. 4. C. J. Chen.
Non-linear Pulses in Integrated and Waveguide Optics
Introduction to Scanning Tunneling Microscopy
Introduction to Scanning Tunneling Microscopy C. JULIAN CHEN IBM Research Division Thomas J. Watson Research Center Yorktown Heights, New York
New York Oxford OXFORD UNIVERSITY PRESS 1993
Oxford University Press Oxford New York Toronto Delhi Bombay Calcutta Madras Karachi Kuala Lumpur Singapore Hong Kong Tokyo Nairobi Dar es Salaam Cape Town Melbourne Auckland Madrid and associated companies in Berlin Ibadan
Copyright © 1993 by Oxford University Press, Inc. Published by Oxford University Press, Inc., 200 Madison Avenue, New York, New York 10016 Oxford is a registered trademark of Oxford University Press All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted, in any form or by any means, electronic, mechanical, photocopying, recording, or otherwise, without the prior permission of Oxford University Press. Library of Congress Cataloging-in-Publication Data Chen, C. Julian. Introduction to scanning tunneling microscopy / C. Julian Chen. p. cm. (Oxford series in optical and imaging sciences ; 4) Includes bibliographical references (p. ) and index. ISBN 0-19-507150-6 1. Scanning tunneling microscopy. I. Title. II. Series. QH212.S35C44 1993 502'.8'2—dc20 92-40047
Printed in the United States of America on acid-free paper 3 5 7 9 8 6 4 22
PREFACE It has been more than 10 years since the scanning tunneling microscope (STM) made its debut by resolving the structure of Si(l 11)-7X7 in real space (Binnig, Rohrer, Gerber, and Weibel, 1983). This new instrument has proved to be an extremely powerful tool for many disciplines in condensed-matter physics, chemistry, and biology. The STM can resolve local electronic structure at an atomic scale on literally every kind of conducting solid surface, thus also allowing its local atomic structure to be revealed. An extension of scanning tunneling microscopy, atomic force microscopy (AFM), can image the local atomic structure even on insulating surfaces. The ability of STM and AFM to image in various ambiances with virtually no damage or interference to the sample made it possible to obse