Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale.
This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, <EM>in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique.
Electron Backscatter Diffraction in Materials Science Second Edition
Adam J. Schwartz · Mukul Kumar · Brent L. Adams · David P. Field Editors
Electron Backscatter Diffraction in Materials Science Second Edition
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Editors Adam J. Schwartz Lawrence Livermore National Laboratory Physical and Life Sciences Directorate 7000 East Avenue Livermore CA 94550 USA
[email protected] Brent L. Adams Department of Mechanical Engineering Brigham Young University Provo UT 84602 455B Crabtree Technology Building USA b l
[email protected]
Mukul Kumar Lawrence Livermore National Laboratory Physical and Life Sciences Directorate 7000 East Avenue Livermore CA 94550 USA
[email protected] David P. Field School of Mechanical and Materials Engineering Washington State University Pullman WA 99164-2920 Dana 239E USA
[email protected]
First hard cover printing 2000, Kluwer Academic / Plenum Publishers
ISBN 978-0-387-88135-5 DOI 10.1007/978-0-387-88136-2
e-ISBN 978-0-387-88136-2
Library of Congress Control Number: 2009920955 c Springer Science+Business Media, LLC 2009 All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed on acid-free paper springer.com
Contents
1 Present State of Electron Backscatter Diffraction and Prospective Developments . . . . . . . . . . . . . . . . . . . . . Robert A. Schwarzer, David P. Field, Brent L. Adams, Mukul Kumar