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Wireless Security The Newnes Know It All Series PIC Microcontrollers: Know It All Lucio Di Jasio, Tim Wilmshurst, Dogan Ibrahim, John Morton, Martin Bates, Jack Smith, D.W. Smith, and Chuck Hellebuyck ISBN: 978-0-7506-8615-0 Embedded Software: Know It All Jean Labrosse, Jack Ganssle, Tammy Noergaard, Robert Oshana, Colin Walls, Keith Curtis, Jason Andrews, David J. Katz, Rick Gentile, Kamal Hyder, and Bob Perrin ISBN: 978-0-7506-8583-2 Embedded Hardware: Know It All Jack Ganssle, Tammy Noergaard, Fred Eady, Lewin Edwards, David J. Katz, Rick Gentile, Ken Arnold, Kamal Hyder, and Bob Perrin ISBN: 978-0-7506-8584-9 Wireless Networking: Know It All Praphul Chandra, Daniel M. Dobkin, Alan Bensky, Ron Olexa, David A. Lide, and Farid Dowla ISBN: 978-0-7506-8582-5 RF & Wireless Technologies: Know It All Bruce Fette, Roberto Aiello, Praphul Chandra, Daniel Dobkin, Alan Bensky, Douglas Miron, David Lide, Farid Dowla, and Ron Olexa ISBN: 978-0-7506-8581-8 Electrical Engineering: Know It All Clive Maxfield, Alan Bensky, John Bird, W. Bolton, Izzat Darwazeh, Walt Kester, M.A. Laughton, Andrew Leven, Luis Moura, Ron Schmitt, Keith Sueker, Mike Tooley, D.F. Warne, and Tim Williams ISBN: 978-1-85617-528-9 Audio Engineering: Know It All Ian Sinclair, Richard Brice, Don Davis, Ben Duncan, John Linsley Hood, Eugene Patronis, Andrew Singmin, and John Watkinson ISBN: 978-1-85617-526-5 Circuit Design: Know It All Darren Ashby, Bonnie Baker, Stuart Ball, John Crowe, Barrie Hayes-Gill, Ian Grout, Ian Hickman, Walt Kester, Ron Mancini, Robert A. Pease, Mike Tooley, Tim Williams, Peter Wilson, and Bob Zeidman ISBN: 978-1-85617-527-2 Test and Measurement: Know It All Jon Wilson, Stuart Ball, G.M.S de Silva, Tony Fischer-Cripps, Dogan Ibrahim, Kevin James, Walt Kester, Michael Laughton, Chris Nadovich, Alex Porter, Ed Ramsden, Steve Scheiber, Douglas Warne, and Tim Williams ISBN: 978-1-85617-530-2 Wireless Security: Know It All Praphul Chandra, Alan Bensky, Tony Bradley, Chris Hurley, Steve Rackley, James Ransome, John Rittinghouse, Timothy Stapko, George Stefanek, Frank Thornton, and Jon Wilson ISBN: 978-1-85617-529-6 For more information on these and other Newnes titles visit: www.newnespress.com Wireless Security Praphul Chandra Alan Bensky Tony Bradley Chris Hurley Steve Rackley John Rittinghouse James F. Ransome Timothy Stapko George L. Stefanek Frank Thornton Jon Wilson AMSTERDAM • BOSTON • HEIDELBERG • LONDON NEW YORK • OXFORD • PARIS • SAN DIEGO SAN FRANCISCO • SINGAPORE • SYDNEY • TOKYO Newnes is an imprint of Elsevier Newnes is an imprint of Elsevier 30 Corporate Drive, Suite 400, Burlington, MA 01803, USA Linacre House, Jordan Hill, Oxford OX2 8DP, UK Copyright © 2009, Elsevier Inc. All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, or otherwise, without the prior written permission of the publisher. Permissions may be sought directly from Elsevier’s Science & Technology Rights Department in Oxford, UK: phone: (44) 1865 843830, fax: (44) 1865 853333, E-mail: [email protected] You may also complete your request online via the Elsevier homepage (http://elsevier.com), by selecting “Support & Contact” then “Copyright and Permission” and then “Obtaining Permissions.” Library of Congress Cataloging-in-Publication Data Application submitted British Library Cataloguing-in-Publication Data A catalogue record for this book is available from the British Library. ISBN: 978-1-85617-529-6 For information on all Newnes publications visit our Web site at www.elsevierdirect.com Typeset by Charon Tec Ltd., A Macmillan Company. (www.macmillansolutions.com
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