Architecture Design For Soft Errors

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This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them

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ARCHITECTURE DESIGN FOR SOFT ERRORS This page intentionally left blank ARCHITECTURE DESIGN FOR SOFT ERRORS Shubu Mukherjee AMSTERDAM • BOSTON • HEIDELBERG • LONDON NEW YORK • OXFORD • PARIS • SAN DIEGO SAN FRANCISCO • SINGAPORE • SYDNEY • TOKYO Morgan Kaufmann Publishers is an imprint of Elsevier Acquisitions Editor Publishing Services Manager Project Manager Editorial Assistant Cover Design Compositor Cover Printer Interior Printer Charles Glaser George Morrison Murthy Karthikeyan Matthew Cater Alisa Andreola diacriTech Phoenix Color, Inc. Sheridan Books Morgan Kaufmann Publishers is an imprint of Elsevier. 30 Corporate Drive, Suite 400, Burlington, MA 01803, USA ∞ This book is printed on acid-free paper.  Copyright © 2008 by Elsevier Inc. All rights reserved. Designations used by companies to distinguish their products are often claimed as trademarks or registered trademarks. In all instances in which Morgan Kaufmann Publishers is aware of a claim, the product names appear in initial capital or all capital letters. Readers, however, should contact the appropriate companies for more complete information regarding trademarks and registration. No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means—electronic, mechanical, photocopying, scanning, or otherwise—without prior written permission of the publisher. Permissions may be sought directly from Elsevier’s Science & Technology Rights Department in Oxford, UK: phone: (+44) 1865 843830, fax: (+44) 1865 853333, E-mail: [email protected] You may also complete your request online via the Elsevier homepage (http://elsevier.com), by selecting “Support & Contact” then “Copyright and Permission” and then “Obtaining Permissions.” Library of Congress Cataloging-in-Publication Data Mukherjee, Shubu. Architecture design for soft errors/Shubu Mukherjee. p. cm. Includes index. ISBN 978-0-12-369529-1 1. Integrated circuits. 2. Integrated circuits—Effect of radiation on. 3. Computer architecture. 4. System design. I. Title. TK7874.M86143 2008 621.3815–dc22 2007048527 British Library Cataloguing in Publication Data A catalogue record for this book is available from the British Library ISBN: 978-0-12-369529-1 For information on all Morgan Kaufmann publications, visit our Web site at www.mkp.com or www.books.elsevier.com Printed and bound in the United States of America 08 09 10 11 12 5 4 3 2 1 To my wife Mimi, my daughter Rianna, and my son Ryone and In remembrance of my late father Ardhendu S. Mukherjee This page intentionally left blank Contents Foreword xiii Preface xvii
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