Radiometric Temperature Measurements: Ii. Applications

E-Book Overview

This book describes the practice of radiation thermometry, both at a primary level and for a variety of applications, such as in the materials processing industries and remote sensing. This book is written for those who will a) apply radiation thermometry in industrial practice b) use radiation thermometers for scientific research, c) the radiation thermometry specialist in a national measurement institute d) developers of radiation thermometers who are working to innovate products for instrument manufacturers and e) developers non-contact thermometry methods to address challenging thermometry problems. The author(s) of each chapter were chosen from a group of international scientists who are experts in the field and specialist(s) on the subject matter covered in the chapter. A large number of references are included at the end of each chapter as a resource for those seeking a deeper or more detailed understanding. This book is more than a practice guide. Readers will gain in-depth knowledge in: (1) the proper selection of the type of thermometer; (2) the best practice in using the radiation thermometers; (3) awareness of the error sources and subsequent appropriate procedure to reduce the overall uncertainty; and (4) understanding of the calibration chain and its current limitations. Coverage of all fundamental aspects of the radiometric measurementsCoverage of practical applications with details on the instrumentation, calibration, and error sourcesAuthors are from the national labs internationally leading in R&D in temperature measurementsComprehensive coverage with large number of references

E-Book Content

EXPERIMENTAL METHODS PHYSICAL SCIENCES IN THE Thomas Lucatorto and Albert C. Parr, Editors in Chief Founding Editors L. MARTON C. MARTON VOLUME FOURTY THREE EXPERIMENTAL METHODS PHYSICAL SCIENCES IN THE RADIOMETRIC TEMPERATURE MEASUREMENTS II. Applications Editors Zhuomin M. Zhang George W. Woodruff School of Mechanical Engineering Georgia Institute of Technology Atlanta, GA 30332-0405, USA Benjamin K. Tsai Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8441, USA Graham Machin Engineering Measurement Division National Physical Laboratory Teddington, Middlesex, TW11 0LW, UK Amsterdam  Boston  Heidelberg  London  New York  Oxford Paris  San Diego  San Francisco  Singapore  Sydney  Tokyo Academic Press is an imprint of Elsevier Academic Press is an imprint of Elsevier Linacre House, Jordan Hill, Oxford OX2 8DP, UK 84 Theobald’s Road, London WC1X 8RR, UK Radarweg 29, PO Box 211, 1000 AE Amsterdam, The Netherlands 30 Corporate Drive, Suite 400, Burlington, MA 01803, USA 525 B Street, Suite 1900, San Diego, CA 92101-4495, USA Copyright r 2010 Elsevier Inc. All rights reserved No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any means electronic, mechanical, photocopying, recording or otherwise without the prior written permission of the publisher Permissions may be sought directly from Elsevier’s Science & Technology Rights Department in Oxford, UK: phone (+44) (0) 1865 843830; fax (+44) (0) 1865 853333; email: [email protected] Alternatively you can submit your request online by visiting the Elsevier web site at http://www.elsevier.com/locate/permissions, and selecting Obtaining permission to use Elsevier material Notice No responsibility is assumed by the publisher for any injury and/or damage to persons or property as a matter of products liability, negligence or otherwise, or from any use or operation of any methods, products, instructions or ideas contained in the material h
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