Transmission Electron Microscopy and Diffractometry of Materials Springer-Verlag Berlin Heidelberg GmbH Physics and Astronomy ONLINE LIBRARY http://www.springer.de/phys/ High resolution transmission electron microscopy (HRTEM) image of a lead crystal between two crystals of aluminum (i.e., a Pb precipitate at a grain boundary in Al). The two crystals of Al have different orientations, evident from their different patterns of atom columns. Note the commensurate atom matehing of the Pb crystal with the Al crystal at right, and incommensurate atom matching at left. An isolated Pb precipitate is seen to the right. The HRTEM method is the topic of Chapter 10. Image courtesy of U. Dahmen, National Center for Electron Microscopy, Berkeley. Brent Fultz James Howe Transmission Electron Microscopy and Diffractometry of Materials With 423 Figures and Numerous Exercises t Springer Professor Brent Fultz Professor Iames M. Howe California Institute of Technology Divis ion ofEngineering and Applied Science Pasadena, CA 91125 USA E-mail:
[email protected] . caltech . edu University of Virginia Department of Materials Science and Engineering Charlottesville, VA22904-4 745 USA E-mail:
[email protected] .edu Library of Congress Cataloging-in-Publication Data . Fultz , B.(Brent) Transmission electron microscopy and diffractometry of materials/ Brent Pultz, [ames Howe. p.cm . Includes bibliographical references and index. 1. Materials-Microscopy. 2. Tansmission electron microscopy. 3. X-ray diffractometer. I. Howe, Iames M., 1955- , 11. Title . TA417.23.F85 2001 620.1'1299-dC21 00-049275 ISSN 1439-2674 ISBN 978-3-662-04518-3 ISBN 978-3-662-04516-9 (eBook) DOI 10.1007/978-3-662-04516-9 This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer-Verlag. Violations are liable for prosecution under the German Copyright Law. © Springer-Verlag Berlin Heidelberg 2001 Originally published by Springer-Verlag Berlin Heidelberg New York in 2001. Softcover reprint of the hardcover Ist edition 200 I The use of general descriptive names, registered names, trademarks, etc . in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use . Typesetting: Camera ready copy by the authors using aSpringer TEXmacro package Cover design: design & production GmbH, Heidelberg Printed on acid-free paper SPIN 10757895 57/3141/tr 54 3 210 This book is dedi cated to our students - past , present and future . Preface Aims and Scope of the Book This textbook was written for advanced undergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials characterization research using TEM